A new technical paper titled “Electron Microscopy-based Automatic Defect Inspection for Semiconductor Manufacturing: A Systematic Review” was published by researchers at KU Leuven and imec. “In this ...

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This paper shows that the Expectation-Maximization (EM) algorithm for regime-switching dynamic factor models provides satisfactory performance relative to other estimation methods and delivers a good ...

To address traditional impedance control methods' difficulty with obtaining stable forces during robot-skin contact, a force control based on the Gaussian mixture model/Gaussian mixture regression ...